2D MEMS Probe Card For CIS

2D MEMS Probe Card For CIS

CIS-Specific 2D MEMS Probe Card

• Applied in CIS product testing using 2D MEMS technology

• Thousands of MEMS probes directly laser-welded onto ceramic substrate

• High-density probe distribution with precise alignment, reducing manual intervention, lowering error rates, and cutting costs

• Optimized mechanical design with gold/rhodium plating enables lower particulate contamination and excellent contact resistance

Features

• Laser welding accuracy down to 60 um, ensuring stable yield and precise alignment

• Decoupling capacitors positioned closer to test sites / low probe tip height / reduced loop inductance

• Reduced scratch and displacement, ultra-low particulate contamination (mark size)

• 9.4 um @ 80 um O/D

• Probes individually replaceable for easier maintenance